Code: mk3temer04hx17-en
ECTS Credit Points: 4
Evaluation: mid-semester grade, measurement report
Year, Semester: 2nd year, 2nd semester
Its prerequisite(s): Electrotechnics and Electronics
Further courses are built on it: Yes/No
Number of teaching hours/week (lecture + practice): 2+2
Topics:
Detectors (sensors) and transducers. Grouping the sensors. The measuring device structure and characteristics. Unit of measurement systems. Measurement error. Measurement methods. Electro-mechanical - and electronic instruments. Digital instruments. Microelectronic sensors. Elastic deformation measuring devices. Temperature, light and radiation detectors. Thermocouples, thermometers metal, semiconductor thermometers-; Optical gates-; Capacitive proximity switches-; Ultrasonic sensors-; structure, operating principles and properties. Foil Version strain gauges, semiconductor strain gauges, strain sensor wire, one, two and four-sensor bridge circuit. Fiber optic sensors. Signal processing systems. Pressure, temperature, strain and measurement of rotary motion using National Instruments LabVIEW software.
Literature:
Compulsory:
- Aciatore, David G.: Introduction to mechatronics and measurement systems, Boston, 2007, Isbn: 007 125407 2
- Ed. Robert H. Bishop: The Mechatronics Handbook, Section III: Sensors and actuators
Recommended:
- David G. Alciatore, Michael B. Histand: Introduction to mechatronics and measurement systems 1st. McGraw-Hill, 2013. Isbn: 978-0073380230
- U. A. Bakshi – V.U. Bakshi: Electronic Measurement and Instrumentation 1st. Technical Publications Pune, 2009. Isbn: 9788184315295
| 1st week | 8th week |
|---|---|
| Registration week | 1st drawing week |
| 2nd week | 9th week |
| Lecture: Basic concepts of measurement. Sensors (sensors) and transducers. The sensors are grouped. The structure and characteristics of the measuring apparatus. Measurement Systems. Measurement errors. Measurement methods. Practical: General description about laboratory regulations. Accident prevention and safety education. | Lecture: A capacitive proximity switch. Its structure, working principle, characteristics and application areas. Practical: Measuring of capacitive proximity switch. |
| 3rd week | 10th week |
| Lecture: Theoretical basis of Light electric effect sensors. The photodiode and photovoltaic structure, modes of operation and application. Multi-color LEDs. The structure and characteristics of optical interfaces. The scanner structure and characteristics of CCD sensors. Practical: Examination of solar cell. | Lecture: Ultrasonic sensors. Their structures, working principles, characteristics, and application areas. Practical: Measuring of an ultrasonic distance sensor. |
| 4th week | 11th week |
| Lecture: Types of photo resist and application. The structure and features of a phototransistor. The structure and use of a light pencil. The structure, characterization and application of a liquid crystal display. Practical: Measurement of LED characteristics. | Lecture: Strain gages. Foil strain gauges, semiconductor strain gauge, strain sensor wires, one, two and four-sensing bridge circuits. Practical: Measuring of strain gages. |
| 5th week | 12th week |
| Lecture: Measuring elastic deformation instruments. Piezoelectric and piezoresistive sensors. Elastic deformation measuring instruments. Bellows. Microelectronic capacitive pressure sensors. PN-gradient sensors and the MOSFET structure. Practical: Measurement of elastic deformation | Lecture: The Reed switch and magneto inductive sensors. Their structures, working principles, characteristics and Application areas. Practical: Measuring of reed switch |
| 6th week | 13th week |
| Lecture: Thermoelectric sensors. The operating principles, construction and characteristics of an infrared motion sensor. Thermoelectric transducer coupling, the PVDF film. Thermocouples, semiconductor structure, function and features of metal thermometers and other thermometers. Practical: Measurement of temperature | Lecture: Description of the main features of the NI LabVIEW software. Practical: National Instrumnets with hardware and software. Edit VI. Measuring system construction, Troubleshooting practice |
| 7th week | 14th week |
| Lecture: An optical gate. Its structure, working principle and characteristics and application areas. Practical: Measurement of an optical gate. | Lecture: Structure of the NI data acquisition systems. DAQ connecting to your computer. Practical: Recording and evaluation of data measured by National Instruments Hardware |
| 15th week | |
| 2nd drawing week: End-term test |
Requirements
A, for a signature:
Attendance at lectures is recommended, but not compulsory. Participation at practice classes is compulsory. A student must attend the practice classes and may not miss more than three times during the semester. In case a student does so, the subject will not be signed and the student must repeat the course. A student can’t make up a practice class with another group. Attendance at practice classes will be recorded by the practice leader. Being late is equivalent with absence. Missed practices should be made up for at a later date, being discussed with the tutor. Active participation is evaluated by the teacher in every class. If a student’s behavior or conduct doesn’t meet the requirements of active participation, the teacher may evaluate his or her participation as an absence because of the lack of active participation in the class. Students have to submit all the twelve reports as scheduled minimum at a sufficient level. During the semester there are two tests: the mid-term test is in the 8th week and the end-term test in the 15th week.
B, for grade:
Based on the average of the grades of the reports and the test results, the mid-semester grade is calculated as an average of them: - the average grade of the twelve reports (50 %) - the grade of the tests (50 %). The minimum requirement for end-term test is 60%. Based on the score of the test separately, the grade for the test is given according to the following table:
0-59 % = fail (1); 60-69 % = pass (2); 70-79 % = satisfactory (3); 80-89 % = good (4); 90-100 % = excellent (5)